This paper introduces a model and design of an innovative bandpass (BP) negative group delay (NGD) distributed circuit. The passive circuit topology under study is constituted by fully distributed elements without lumped components. The NGD passive structure is implemented as a ladder shape topology composed of distributed transmission line (TL) elements. The S-matrix model is established from TL-based equivalent Z-matrix operations with respect to the ladder geometry. As a proof of concept, a two-cell ladder prototype is designed in microstrip technology, which is simulated, fabricated, and tested. The calculated and simulated measurements are in very good agreement with the validation of BP NGD behaviour. NGD value is better than −3 ns with centre frequency between 3.56 and 3.68 GHz over more than 30 MHz NGD bandwidth being observed. The circuit operates under insertion loss better than 5 dB and reflection loss better than 8 dB. This innovative BP NGD passive circuit can be useful in the RF and microwave engineering area, for example, to reduce the signal propagation delay in the upcoming and 5G telecommunication systems.

International audienceToday, the performances of integrated electronic circuits are limited by global interconnects. To achieve in performance, one needs to consider new solutions to carry the information in the chips or along the system. This communication deals with the study of RF interconnects, which is among the options under discussion within the ITRS [1]. At first, we recall the concept of RF interconnects to further illustrate it in the case of 4-bit transmission. Then, we calculate the transfer function of a complete RF interconnect to identify the parameters to be optimized, in order to increase the gain and obtain relative plane curves over a wide frequency band. Finally, we conduct on electromagnetic study of various coupling options that can be expected when using the available technologies

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This paper investigates the design method, characterization, and innovative uncertainty analysis of bandpass (BP) type negative group delay (NGD) passive cell. The lumped passive topology under study consists of a resistor and a passive RLC-series network. The voltage transfer function (VTF) based circuit theory introducing the BP NGD specification analytical expressions is established in function of the R, L, and C lumped component parameters. The BP NGD performance is evaluated by figure of merit (FOM) formula. To demonstrate the BP NGD function, the design method was applied to a proof-of-concept (POC) operating at 125-kHz RFID standard center frequency. The BP NGD theory is validated by both AC simulation and measurement of POC and discrete component-based circuit prototype. Experimental BP NGD results in good agreement with calculation and simulation are obtained with NGD value of −36.77 µs, 8% NGD bandwidth, and an attenuation lower than −9.6 dB. Innovative expressions of BP NGD parameter uncertainties are established versus the POC circuit parameters. The BP NGD specification variations are interpreted with respect to the influence of constituting component uncertainties via comparison between the established NGD uncertainty theory and co-simulated sensitivity analyses.