Heteroepitaxial GaN and GaAs films were grown by both conventional two-step MOCVD and the new “capillary epitaxy” technique on (001) and (111) fianite (YSZ) substrates. The capillary epitaxy technique was investigated for the example of GaAs films growth on a YSZ substrate. This technique allows both the reduction of the minimum thickness and the improvement of the quality of III-V films. PL spectra of undoped GaN films on YSZ were studied.
Subrmicron heteroepitaxial GaAs and GaN films were grown by both conventional MOCVD and «capillary epitaxy» technique on (001) and (111) fianit (YSZ)substrates. A preliminary annealing of the substrates under vakuum was made in order to stabilize the surface by removing of some amount of oxygen. Conditions of single crystalline growth of GaAs submicron films (50–500nm) have been determined. The films had mirror-like surface morphology and high structural perfection. The distribution of Zr, O, Y across the film-substrate interface was sharp and doping impurities contents were uniform over the film. PL spectra of undoped GaN films on YSZ were studied.
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