: PV module is conventionally connected in series with some solar cell to adjust the output of module. Some bypass diodes in module are installed to prevent module from hot spot and mismatch power loss. However, bypass diode in module exposed outdoor is easily damaged by surge voltage. In this paper, we study the thermal and electrical characteristics change of module with damaged bypass diode to easily find module with damaged bypass diode in photovoltaic system consisting of many modules. Firstly, the temperature change of bypass diode is measured according to forward and reverse bias current flowing through bypass diode. The maximum surface temperature of damaged bypass diode applied reverse bias is higher than that of normal bypass diode despite flowing equal current. Also, the output change of module with and without damaged bypass diode is observed. The output of module with damaged bypass diode is proportionally reduced by the total number of connected solar cells per one bypass diode. Lastly, the distribution temperature of module with damaged bypass diode is confirmed by IR camera. Temperature of all solar cells connected with damaged bypass diode rises and even hot spot of some solar cells is observed. We confirm that damaged bypass diodes in module lead to power drop of module, temperature rise of module and temperature rise of bypass diode. Those results are used to find module with a damaged bypass diode in system.
:A bypass diode is connected in parallel to solar cells with opposite polarity. The advantage of using the bypass diode is circumvented a destructive efforts of hot-spot heating in the photovoltaic(PV) module. In addition, it is possible to reduce a energy loss under the partial shading on the PV module. This paper presents a characteristic of photovoltaic module under partial shading condition and with defective bypass diode by using the experimental data. The results of field testing for each photovoltaic modules, when photovoltaic system which is connected power grid is operating, the inner junction-box temperature of shading photovoltaic module is high 5℃ because of difference of flowing current through into bypass diode. And incase of not operating photovoltaic system, the inner junction-box temperature of module with defective bypass diode is greatly higher than partial shading PV module.
In Korea, there is a rule for Renewable Energy Certification with weighting 5.0, to expand grid linkage capacity and to improve the stability of the grid to accommodate photovoltaic (PV) systems in a distributed power system. Due to this rule, many power companies and operators are trying to install electrical energy storage systems that are able to operate in conjunction with PV system power. These systems operate in parallel at the same grid connection point. This paper presents the results of case studies on the failure to detect islanding operation. Test evaluation devices that could be bi-directionally charged and discharged were implemented for an islanding detection test. Testing was conducted under a variety of operating conditions. When a single inverter was operated under the islanding condition, it was stably stopped within 0.5 s using the Korean grid-code standard. However, when two inverters were operated at the same time under the islanding condition, islanding detection failed and the two inverters continued to feed the connected RLC (resistor, inductor, capacitor) loads in the isolated section known as an island. Different algorithms used by PCS (power conversion system) manufacturers to detect islanding might cause this phenomenon. Therefore, it is necessary for a new PCS test standard to detect islanding.
In the potential induced degradation (PID) phenomenon, the output power of a photovoltaic (PV) module decreases due to the high potential difference between the PV system and the ground. This voltage forcefully moves the positive charge in the module to the surface of the solar cell. The accumulated charge leads to the performance deterioration of the module, namely, PID of the module. We conducted a study to accurately predict the output reduction of the module operating in various installation conditions coming from the PID phenomenon. We investigated the leakage current flowing through front glass laminated with encapsulation material simultaneously exposed to various performance conditions of the PV system, namely, relative humidity, temperature, and applied voltage, which have an important effect on the PID of the module. The degradation of the module coming from PID was calculated on the basis of the obtained leakage current. To confirm the calculated data, modules with one solar cell were manufactured and the power loss results of the modules' exposure to various PID generation experiments were compared with the expected results. The results showed that we could predict the degradation of the modules by PID within a 2% tolerance under the PV system installation conditions.
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