Analysis on thermal &amp; electrical characteristics variation of PV module with damaged bypass diodes

Woo-Gyun, Shin; Jung, Timothy; Go, Seok-Hwan; Ju, Young-Chul; Chang, Hyo Sik; Kang, Gi‐Hwan

doi:10.7836/kses.2015.35.4.067

Cited by 12 publications

(5 citation statements)

References 6 publications

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“…Therefore, the annual degradation rate by the failed bypass diode was about 11% or 25% depending on the climatic conditions [25]. A bypass diode fault results in an output loss due to a decrease of the open circuit voltage because the potential (voltage) difference of strings connected with a failed bypass diode is about 0 V. Additionally it elevates the surface temperature of the solar cells in the PV module, thereby resulting in the lower performance of the PV power plant [26].…”

Section: Introductionmentioning

confidence: 99%

Origin of Bypass Diode Fault in c-Si Photovoltaic Modules: Leakage Current under High Surrounding Temperature

Shin

Song

et al. 2018

Energies

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Bypass diodes have been widely utilized in crystalline silicon (c-Si) photovoltaic (PV) modules to maximize the output of a PV module array under partially shaded conditions. A Schottky diode is used as the bypass diode in c-Si PV modules due to its low operating voltage. In this work, we systematically investigated the origin of bypass diode faults in c-Si PV modules operated outdoors. The temperature of the inner junction box where the bypass diode is installed increases as the ambient temperature increases. Its temperature rises to over 70 °C on sunny days in summer. As the temperature of the junction box increases from 25 to 70 °C, the leakage current increases up to 35 times under a reverse voltage of 15 V. As a result of the high leakage current of the bypass diode at high temperature, melt down of the junction barrier between the metal and semiconductor has been observed in damaged diodes collected from abnormally functioning PV modules. Thus, it is believed that the constant leakage current applied to the junction caused the melting of the junction, thereby resulting in a failure of both the bypass diode and the c-Si PV module.

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Section: Introductionmentioning

confidence: 99%

Origin of Bypass Diode Fault in c-Si Photovoltaic Modules: Leakage Current under High Surrounding Temperature

Shin

Song

et al. 2018

Energies

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“…A short circuit of the SD does not have devastating consequences, but it leads to a decrease in output due to the withdrawal of part of the solar cells of the SP and accelerates their degradation (W. G. Shin et al, 2018), (Davarifar et al, 2013), (W.-G. Shin et al, 2015). Among the methods for diagnosing malfunctions of stepper motors as part of the joint venture, the following methods can be distinguished: visual inspection (Köntges М, 2014); method of thermal imaging diagnostics (Kato, 2011), (Köntges М, 2014); analytics of current-voltage characteristics (CVC) of the joint venture (Ziar et al, 2014), (Köntges М, 2014), (Davarifar et al, 2013), (Dhimish M, 2017); various variations and syntheses of the above methods (for example, thermal imaging diagnostics using an external source) (Tsanakas et al, 2017), (Köntges et al, 2009).…”

Section: Operation Of the Shunt Diode Under Different Conditionsmentioning

confidence: 99%

Solar panel shunt diodes and techniques for diagnosing them

Shaturaev

Muhabbat

Farxod

et al. 2023

Preprint

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The research article indicates the importance of carrying out measures for the diagnosis and maintenance of good-order standing shunt diodes as part of the solar panel. The study was carried out using the theoretical analytical analysis of information data on shunt diodes and their diagnostics. Defects considered solar panels due to defective shunt diodes. Used computer modeling in the PVSYST program, simulation of failures of shunt diodes on solar YL-250P-29b panels and their diagnostics by methods of short-circuit current analysis at partial shading and open circuit voltage parameter under normal conditions. It has been established that the methods of thermal imaging diagnostics (including using a drone) and visual inspection are not accurate tools. cops searching for faulty shunt diodes. For small solar power plants (as well as for diagnostic sticks of shunt diodes of solar panels from spare parts, tools, and fixtures on large solar power plants), short-circuit current analysis methods are applicable in partial shading and open circuit voltage parameter under normal conditions. For a complete diagnosis of shunt faults diodes at large solar power plants, the method of thermal imaging diagnostics using an external source.

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“…In this regard, there is a study that released which changes in the electrical property at PV module caused by a failure of the bypass diode (shown as F6 in Figure 2). The failure bypass diodes lose their properties of forward and reverse bias to become a micro-resistance, and are in a short circuit state with solar cells that are connected to a fault bypass diode [12,15,16]. Furthermore, recent research reported, when the bypass diode is shorted failure while the PV system is stopped, the temperature of a junction box increases [12].…”

Section: Bypass Diode Faultmentioning

confidence: 99%

Simulation of fault detection in photovoltaic arrays

Lipták

Bodnár

2021

Anal. Tech. Szeged.

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In solar systems, faults in the module and inverter occur in proportion to increased operating time. The identification of fault types and their effects is important information not only for manufacturers but also for investors, solar operators and researchers. Monitoring and diagnosing the condition of photovoltaic (PV) systems is becoming essential to maximize electric power generation, increase the reliability and lifetime of PV power plants. Any faults in the PV modules cause negative economic and safety impacts, reducing the performance of the system and making unwanted electric connections that can be dangerous for the user. In this paper have been classified all possible faults that happen in the PV system, and is presented to detect common PV array faults, such as open-circuit fault, line-to-line fault, ground fault, shading condition, degradation fault and bypass diode fault. In this studies examines the equivalent circuits of PV arrays with different topological configurations and fault conditions to evaluate the effects of these faults on the performance of a solar system, taking into account the influence of temperature and solar radiation. This work presents the validation of a simulated solar network by measuring the output curves of a low-power photovoltaic array system under real outdoor conditions. This method can be useful in future solar systems.

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Analysis on thermal & electrical characteristics variation of PV module with damaged bypass diodes

Cited by 12 publications

References 6 publications

Origin of Bypass Diode Fault in c-Si Photovoltaic Modules: Leakage Current under High Surrounding Temperature

Origin of Bypass Diode Fault in c-Si Photovoltaic Modules: Leakage Current under High Surrounding Temperature

Solar panel shunt diodes and techniques for diagnosing them

Simulation of fault detection in photovoltaic arrays

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