Depth profiling analysis of sodium (Na)-implanted polyethylene terephthalate was performed by using time-of-flight secondary ion mass spectrometry in the cesium-attachment regime. A radical redistribution of the main element due to diffusion and escape of some elements, such as oxygen and hydrogen, and carbonization of a top 550 nm layer were observed. The depth distribution of the implanted sodium was found to be radically different from the "theoretical" distribution calculated by using the Monte Carlo simulation method (TRIM code). We conclude that it is possible to perform an effective depth profiling analysis of an implanted polymer in the "standard" secondary ion mass spectrometry regime without using a big cluster primary ion beam.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.