No abstract

Abstract-SiGe HBT heavy ion-induced current transients are measured using Sandia National Laboratories' microbeam and high-and low-energy broadbeam sources at the Grand Accélérateur National d'Ions Lourds and the University of Jyväskylä. The data were captured using a custom broadband IC package and real-time digital phosphor oscilloscopes with at least 16 GHz of analog bandwidth. These data provide detailed insight into the effects of ion strike location, range, and LET.