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It has been shown earlier that, if we restrict to unate gate network (UGN) realizations, there exist universal test sets for boolean functions. Such a test set only depends on the function f , and checks any UGN realization of f for all multiple stuck-at faults and all robustly testable stuck-open faults. In this paper we prove that these universal test sets are much more powerful than implied by the above results: They also constitute complete delay fault test sets for arbitrary UGN implementations of a given function. This is even true for UGN networks which are not testable with respect to the gate or path delay fault model. Our ability to prove the temporal correctness of such circuit realizations, comes from the fact that we do not argue the correctness of individual paths, but complete path systems. Keywords| Delay test, unate gate networks, universal test sets, design for testability.

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