1999
DOI: 10.1109/92.766742
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Universal delay test sets for logic networks

Abstract: It has been shown earlier that, if we restrict to unate gate network (UGN) realizations, there exist universal test sets for boolean functions. Such a test set only depends on the function f , and checks any UGN realization of f for all multiple stuck-at faults and all robustly testable stuck-open faults. In this paper we prove that these universal test sets are much more powerful than implied by the above results: They also constitute complete delay fault test sets for arbitrary UGN implementations of a given… Show more

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Cited by 14 publications
(12 citation statements)
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“…It is proved that the two-pattern testing of TRLCs with only all-0 and all-1 initial vectors achieves complete fault coverage [8]. Here, we evaluate the area overhead, the fault coverage, and the test application time.…”
Section: Discussionmentioning
confidence: 99%
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“…It is proved that the two-pattern testing of TRLCs with only all-0 and all-1 initial vectors achieves complete fault coverage [8]. Here, we evaluate the area overhead, the fault coverage, and the test application time.…”
Section: Discussionmentioning
confidence: 99%
“…Here, delay fault testing with the proposed scan design is † The assumed delay fault model of the proposed method is the same as that of the paper [8]. The test set shown in the paper [8] sensitizes all path system robustly.…”
Section: Delay Fault Testing In Proposed Scan Designmentioning
confidence: 99%
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