This paper presents empirically based ultrawideband and directional channel measurements, performed in the Terahertz (THz) frequency range over 250 GHz bandwidth from 500 GHz to 750 GHz. Measurement setup calibration technique is presented for free-space measurements taken at Line-of-Sight (LoS) between the transmitter (Tx) and receiver (Rx) in an indoor environment. The atmospheric effects on signal propagation in terms of molecular absorption by oxygen and water molecules are calculated and normalized. Channel impulse responses (CIRs) are acquired for the LoS scenario for different antenna separation distances. From the CIRs the Power Delay Profile (PDP) is presented where multiple delay taps can be observed caused due to group delay products and reflections from the measurement bench.
This paper presents a comparison between specified dimensions given in document standards (IEEE Std 1785.2-2016) and measured dimensions for interfaces used with rectangular metallic waveguides at submillimeter wavelengths. The standardized dimensions of these waveguide interfaces are compared with several waveguides in the WM-380 band (500-750 GHz) manufactured by two different companies. The measured electrical performance (in terms of reflection coefficient) for these waveguide interfaces is also compared with values given in documentary standards. The paper shows that although the manufactured waveguides do not strictly adhere to the dimensions given in the standard, very good electrical performance is still achievable by using slightly different dimensions for the manufactured waveguide interfaces. The use of additional alignment dowel pins (as specified in the IEEE standard) further improves the electrical performance of these interfaces.
This paper presents a detailed assessment of two rectangular metallic waveguide lines in order that they can be used as primary standards to provide metrological traceability for electrical scattering parameter measurements at submillimetre wavelengths. The assessment comprises a series of dimensional measurements to determine the overall quality of the lines in terms of the waveguide aperture size and alignment. This is followed by electrical measurements to confirm the electrical behaviour of the lines. Finally, the lines are employed as standards to calibrate a vector network analyser which is used to measure devices to verify the performance of the lines as calibration standards, in operando. The waveguide size is WM-380, which operates from 500 GHz to 750 GHz.
Uncertainties in typical small-signal and large-signal amplifier parameters measured using a vector network analyzer (VNA) are investigated in this paper. Methods to evaluate the measurement uncertainty in return losses, input power, output power, power gain, 1 dB compression point, etc, based on the use of the VNA dynamic uncertainty option (VNA-DUO) software tool from Keysight Technologies are applied to a commercial amplifier between 0.5 GHz and 8 GHz.
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