A summary of NBTI variation is reported on large data-sets across five generations of Intel technologies (90 nm to 22 nm) and a comparison of statistical frameworks is utilized to show the universality of variation metrics across generations.Large volumes of data and modeling are emphasized as critical to enable accurate simulations of NBTI in extreme tails.
In order to perform block level analysis of the on-chip power distribution network, a high-level model is required that captures the dependence of the current waveform drawn by a logic block, per cycle, on its input vector pair. We present a frequency domain macro-modeling technique for capturing this dependence. The macro-model is based on estimating the Discrete Cosine Transform (DCT) of the current waveform and then taking the inverse transform to estimate the time domain current waveform.
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