There is a great deal of interest in the underlying causes of efficiency droop in InGaN/GaN quantum well light emitting diodes, with several physical mechanisms being put forward to explain the phenomenon. In this paper we report on the observation of a reduction in the localization induced S-shape temperature dependence of the peak photoluminescence energy with increasing excitation power density. This S-shape dependence is a key fingerprint of carrier localization. Over the range of excitation power density where the depth of the S shape is reduced, we also observe a reduction in the integrated photoluminescence intensity per unit excitation power, i.e., efficiency droop. Hence, the onset of efficiency droop occurs at the same carrier density as the onset of carrier delocalization. We correlate these experimental results with the predictions of a theoretical model of the effects of carrier localization due to local variations in the concentration of the randomly distributed In atoms on the optical properties of InGaN/GaN quantum wells. On the basis of this comparison of theory with experiment we attribute the reduction in the S-shape temperature dependence to the saturation of the available localized states. We propose that this saturation of the localized states is a contributory factor to efficiency droop whereby nonlocalized carriers recombine non-radiatively. V
InGaN-based light emitting diodes and multiple quantum wells designed to emit in the green spectral region exhibit, in general, lower internal quantum efficiencies than their blue-emitting counter parts, a phenomenon referred to as the “green gap.” One of the main differences between green-emitting and blue-emitting samples is that the quantum well growth temperature is lower for structures designed to emit at longer wavelengths, in order to reduce the effects of In desorption. In this paper, we report on the impact of the quantum well growth temperature on the optical properties of InGaN/GaN multiple quantum wells designed to emit at 460 nm and 530 nm. It was found that for both sets of samples increasing the temperature at which the InGaN quantum well was grown, while maintaining the same indium composition, led to an increase in the internal quantum efficiency measured at 300 K. These increases in internal quantum efficiency are shown to be due reductions in the non-radiative recombination rate which we attribute to reductions in point defect incorporation.
The luminescence properties of cubic GaN films grown upon 3C‐SiC/Si (001) substrates by MOCVD were investigated. The spectra show luminescence peaks which are associated with donor bound exciton recombination and donor acceptor pair recombination. A reduced peak energy for the D0X emission compared with values reported in the literature suggests a tensile‐strain‐reduced bandgap of approximately 3.27 eV, which is consistent with the absorption edge in photoluminescence‐excitation spectroscopy. The presence of hexagonal material introduces a broad emission band at 3.40 eV with a FWHM of 190 meV, extending to energies up to 3.60 eV. The intensity of this emission scales linearly with excitation power, its peak energy and width remaining unchanged. This band is associated with an absorption edge below 3.70 eV and therefore is not caused by absorption into phase‐pure cubic or hexagonal GaN. The photoluminescence lifetimes measured across this band reduce from 0.40 to 0.20 ns with increasing emission energy. All these observations can be explained by considering a type‐II‐band alignment adjacent to stacking faults within the cubic GaN.
Hyperspectral imaging systems used in plant science or agriculture often have suboptimal signal-to-noise ratio in the blue region (400–500 nm) of the electromagnetic spectrum. Typically there are two principal reasons for this effect, the low sensitivity of the imaging sensor and the low amount of light available from the illuminating source. In plant science, the blue region contains relevant information about the physiology and the health status of a plant. We report on the improvement in sensitivity of a hyperspectral imaging system in the blue region of the spectrum by using supplemental illumination provided by an array of high brightness light emitting diodes (LEDs) with an emission peak at 470 nm.
In this paper we report on the impact that the quantum well growth temperature has on the internal quantum efficiency and carrier recombination dynamics of two sets of InGaN/GaN multiple quantum well samples, designed to emit at 460 and 530 nm, in which the indium content of the quantum wells within each sample set was maintained. Measurements of the internal quantum efficiency of each sample set showed a systematic variation, with quantum wells grown at a higher temperature exhibiting higher internal quantum efficiency and this variation was preserved at all excitation power densities. By investigating the carrier dynamics at both 10 K and 300 K we were able to attribute this change in internal quantum efficiency to a decrease in the non‐radiative recombination rate as the QW growth temperature was increased which we attribute to a decrease in incorporation of the point defects. (© 2015 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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