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We report on systematic study of electronic transport in low-biased, disordered graphene nanowires. We reveal the emergence of unipolar transport as the defect concentration increases beyond 0.3% where an almost insulating behaviour is observed on n-type channels whilst a metallic behaviour is observed in p-type channels. The conductance shows a plateau that extends through the entire side above the Dirac point (n-type) and the conductivity coincides with the minimum conductivity at the Dirac point. The minimum conductivity decreases with increasing defect concentration pointing out towards the absence of zero energy modes in the disordered samples. Raman spectroscopy and X-ray photoemission spectroscopy were used to probe the nature of the defects created by helium ion irradiation and revealed the presence of oxygen-carbon bonds as well as the presence of sp 3 configuration uncovered from the C KLL Auger spectrum. The observed behaviour is attributed to the dangling bonds created by sputtering of carbon atoms in graphene lattice by bombarding helium ions. The dangling bonds act as charge traps, pinning the Fermi level to the Dirac point.

a b s t r a c tThis paper investigates the behaviour of a defective single-gate bilayer graphene transistor. Point defects were introduced into pristine graphene crystal structure using a tightly focused helium ion beam. The transfer characteristics of the exposed transistors were measured ex-situ for different defect concentrations. The channel peak resistance increased with increasing defect concentration whilst the on-off ratio showed a decreasing trend for both electrons and holes. To understand the electrical behaviour of the transistors, a circuit model for bilayer graphene is developed which shows a very good agreement when validated against experimental data. The model allowed parameter extraction of bilayer transistor and can be implemented in circuit level simulators.

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We report a mobility transition in graphene nanoribbons subject to disorder induced by irradiating helium ions. At small irradiation doses defects are created in graphene, enhancing scattering and decreasing the mobility. As the dose is increased further an abrupt transition into an insulating phase is observed characterised by a decrease in electron mobility by more than 5 orders of magnitude. Transmission Electron Microscopy images reveal that heavily He+ irradiated graphene loses its crystallinity as carbon atoms are dislodged from their position by incident ions and reconstruct into an insulating, topologically disordered two-dimensional sp 2 carbon network, where Anderson localisation may possibly play a major role.

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In this paper we first present a new fabrication process of downscaled graphene nanodevices based on direct milling of graphene using an atomic-size helium ion beam. We address the issue of contamination caused by the electron-beam lithography process to pattern the contact metals prior to the ultrafine milling process in the helium ion microscope (HIM). We then present our recent experimental study of the effects of the helium ion exposure on the carrier transport properties. By varying the time of helium ion bombardment onto a bilayer graphene nanoribbon transistor, the change in the transfer characteristics is investigated along with underlying carrier scattering mechanisms. Finally we study the effects of various single defects introduced into extremely-scaled armchair graphene nanoribbons on the carrier transport properties using ab initio simulation.

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