2014
DOI: 10.1016/j.carbon.2014.01.071
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Raman study of damage extent in graphene nanostructures carved by high energy helium ion beam

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Cited by 51 publications
(70 citation statements)
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“…Use of freestanding graphene allowed us to create patterns while avoiding undesirable secondary effects during FIB milling (e.g., ion implanting and substrate swelling), unlike frequently reported for the supported graphene samples. 13,15,32,50 CONCLUSION:…”
Section: Resultsmentioning
confidence: 99%
“…Use of freestanding graphene allowed us to create patterns while avoiding undesirable secondary effects during FIB milling (e.g., ion implanting and substrate swelling), unlike frequently reported for the supported graphene samples. 13,15,32,50 CONCLUSION:…”
Section: Resultsmentioning
confidence: 99%
“…The success of these deconvolutions was validated against the expected energy dispersive behaviour as well as XRD-derived data for the carbons. The relationship between the I D /I G ratio and intraplane point-like defects [24][25][26][27] was then used in conjunction with the Tuinstra-Koenig relationship to derive both the cluster size and intra-plane defect density. This relationship was tested by deliberately introducing point-like defects into selected samples using controlled Ar + ion bombardment.…”
Section: Figmentioning
confidence: 99%
“…One possibility to address this concern is to use the relationship between the I D /I G ratio and intraplane point-like defects derived recently [24][25][26][27] in conjunction with the Tuinstra-Koenig relationship. This has not, however, been done to date as far as the authors are aware.…”
Section: Introductionmentioning
confidence: 99%
“…However, the increased sputter yield of 2D materials on supported substrates also comes at the cost of patterning resolution since the spatial distributions of backscattered ions and recoil atoms can range hundreds of nanometers. 129 In this section, we will review some of the applications in which He þ and Ne þ have been used to process graphene and TMD 2D materials.…”
Section: -15 Stanford Et Almentioning
confidence: 99%