In this study, we demonstrate the stability of high-La 2 O 3 metal-insulator-metal (MIM) capacitors under constant voltage stress (CVS). It was found that the variation in capacitance caused by CVS strongly depends on the injected charges regardless of stress biases. Furthermore, the quadratic voltage coefficient of capacitance () decreases with a logarithmic increase in dielectric loss. Charge trapping contributes to the relative capacitance variation under CVS while the reduced carrier mobility due to the stress-induced traps is responsible for the reduction of .Additionally, high stability of 10-year lifetime is achieved for a 10-nm La 2 O 3 MIM capacitor with an 11.4 fF/mm 2 capacitance density.
A thermochemical determination of the relative solid-state stabilities of the yellow [(Ni (qnqn) CI,},] and violet [Ni(qnqn)CI,] isomers (where q n q n is trans-2-(2-quinolyl)methylenequinuclidin-3-one) has indicated that the violet isomer is the metastable isomer at room temperature. D.t.a.-t.g. measurements have been obtained for the iron, cobalt, nickel, and copper chloride and nickel bromide complexes of q n q n and reveal in the case of the nickel chloride isomers an endothermic structural transformation of the yellow dimer to the violet monomer at 230 'C. No related transformation is observed in the remaining complexes. The unusual inter-related thermal properties of the nickel chloride isomers are discussed in terms of the various properties of the two complexes.
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