Postgrowth thermal annealing of an InGaN/GaN quantum-well sample with a medium level of nominal indium content ͑19%͒ was conducted. From the analyses of high-resolution transmission electron microscopy and energy filter transmission electron microscopy, it was found that thermal annealing at 900 °C led to a quasiregular quantum-dot-like structure. However, such a structure was destroyed when the annealing temperature was raised to 950 °C. Temperature-dependent photoluminescence ͑PL͒ measurements showed quite consistent results. Blueshift of the PL peak position and narrowing of the PL spectral width after thermal annealing were observed.
InGaN p-n junction solar cells with various indium composition and thickness of upper p-InGaN and lower n-InGaN junctions are investigated theoretically. The physical properties of InGaN p-n junction solar cells, such as the short circuit current density (J SC), open circuit voltage (V oc), fill factor (FF), and conversion efficiency (η), are theoretically calculated and simulated by varying the device structures, position of the depletion region, indium content, and photon penetration depth. The results indicate that an In 0.6 Ga 0.4 N solar cell, with optimal device parameters, can have a J SC ~31.8 mA/cm 2 , V oc ~0.874 volt, FF ~0.775, and η ~21.5%. It clearly demonstrates that medium-indium-content InGaN materials have the potential to realize high efficiency solar cells. Furthermore, the simulation results, with various thicknesses of the p-InGaN junction but a fixed thickness of the n-InGaN junction, shows that the performance of InGaN solar cells is determined by the upper p-InGaN junction rather than the n-InGaN substrate. This is attributed to the different amount of light absorption in the depletion region and the variation of the collection efficiency of minority carriers.
In this study, we conducted numerical simulations with the consideration of microelectronic and photonic structures to determine the feasibility of and to design the device structure for the optimized performance of InGaN p-i-n single homojunction solar cells. Operation mechanisms of InGaN p-i-n single homojunction solar cells were explored through the calculation of the characteristic parameters such as the absorption, collection efficiency (χ), open circuit voltage (Voc), short circuit current density (Jsc), and fill factor (FF). Simulation results show that the characteristic parameters of InGaN solar cells strongly depend on the indium content, thickness, and defect density of the i-layer. As the indium content in the cell increases, Jsc and absorption increase while χ, Voc, and FF decrease. The combined effects of the absorption, χ, Voc, Jsc, and FF lead to a higher conversion efficiency in the high-indium-content solar cell. A high-quality In0.75Ga0.25N solar cell with a 4 μm i-layer thickness can exhibit as high a conversion efficiency as ∼23%. In addition, the similar trend of conversion efficiency to that of Jsc shows that Jsc is a dominant factor to determine the performance of p-i-n InGaN solar cells. Furthermore, compared with the previous simulation results without the consideration of defect density, the lower calculated conversion efficiency verifies that the sample quality has a great effect on the performance of a solar cell and a high-quality InGaN alloy is necessary for the device fabrication. Simulation results help us to better understand the electro-optical characteristics of InGaN solar cells and can be utilized for efficiency enhancement through optimization of the device structure.
Based on quantum efficiency and time-resolved electroluminescence measurements, the effects of carrier localization and quantum-confined Stark effect (QCSE) on carrier transport and recombination dynamics of Ga-and N-polar InGaN/GaN light-emitting diodes (LEDs) are reported. The N-polar LED exhibits shorter ns-scale response, rising, delay, and recombination times than the Ga-polar one does. Stronger carrier localization and the combined effects of suppressed QCSE and electric field and lower potential barrier acting upon the forward bias in an N-polar LED provide the advantages of more efficient carrier relaxation and faster carrier recombination. By optimizing growth conditions to enhance the radiative recombination, the advantages of more efficient carrier relaxation and faster carrier recombination in a competitive performance N-polar LED can be realized for applications of high-speed flash LEDs. The research results provide important information for carrier transport and recombination dynamics of an N-polar InGaN/GaN LED. V
We report the roles of island coalescence rate and strain relaxation in the development of anisotropic in-plane strains, striation feature, and subsequent degree of polarization in NH3-flow-rate-dependent m-plane GaN. In the high-NH3-flow-rate samples, the results of cathodoluminescence, polarized Raman and in situ optical reflectance measurements reveal that a slower coalescence and unrelieved lattice misfit strain lead to larger anisotropic in-plane strains, striated surface and luminescence patterns, and a lower density of basal-plane stacking fault (BSF) and prismatic stacking fault (PSF). In contrast, a lower NH3 flow rate leads to more rapid island coalescence and fully relaxed lattice misfit strain such that relaxed in-plane strains, a reduced striation surface, and a higher density of BSF and PSF are observed. It is suggested that the anisotropic in-plane strains, striation feature, and BSF and PSF density are consequences of how rapidly coalescence occurs and the degree of relaxation of lattice misfit strain. In addition, the simulation results of the k · p perturbation approach confirm a larger anisotropic strain results in a smaller degree of polarization. The research results provide important information for optimized growth of nonpolar III-nitrides.
We study thermal annealing effects on the size and composition variations of indium-aggregated clusters in two InGaN thin films with photoluminescence ͑PL͒ in the yellow and red ranges. The methods of investigation include optical measurement, nanoscale material analysis, and theoretical calculation. Such a study is important for determining the relation between the band gap and the average indium content of InGaN. In one of the samples, the major part of the PL spectrum is shifted from the yellow band into the blue range upon thermal annealing. In the other sample, after thermal annealing, a broad spectrum covering the whole visible range is observed. Cathodo-luminescence ͑CL͒ spectra show that the spectral changes occur essentially in the photons emitted from the shallow layers of the InGaN films. Photon emission spectra from the deeper layers are essentially unaffected by thermal annealing. The spectral changes upon thermal annealing are mainly attributed to the general trend of cluster size reduction. This interpretation is supported by the CL, x-ray diffraction, and high-resolution transmission electron microscopy results. To obtain a basic physics picture behind the spectral blue shift upon thermal annealing in the yellow emission sample, we theoretically study the quantum-confinement effects of InGaN clusters based on a quantum box model. The theoretical results can generally explain the large blue shift of PL spectral peak position.
In this study, n-type MoS2 monolayer flakes are grown through chemical vapor deposition (CVD), and a p-type Cu2O thin film is grown via electrochemical deposition. The crystal structure of the grown MoS2 flakes is analyzed through transmission electron microscopy. The monolayer structure of the MoS2 flakes is verified with Raman spectroscopy, multiphoton excitation microscopy, atomic force microscopy, and photoluminescence (PL) measurements. After the preliminary processing of the grown MoS2 flakes, the sample is then transferred onto a Cu2O thin film to complete a p-n heterogeneous structure. Data are confirmed via scanning electron microscopy, SHG, and Raman mapping measurements. The luminous energy gap between the two materials is examined through PL measurements. Results reveal that the thickness of the single-layer MoS2 film is 0.7 nm. PL mapping shows a micro signal generated at the 627 nm wavelength, which belongs to the B2 excitons of MoS2 and tends to increase gradually when it approaches 670 nm. Finally, the biosensor is used to detect lung cancer cell types in hydroplegia significantly reducing the current busy procedures and longer waiting time for detection. The results suggest that the fabricated sensor is highly sensitive to the change in the photocurrent with the number of each cell, the linear regression of the three cell types is as high as 99%. By measuring the slope of the photocurrent, we can identify the type of cells and the number of cells.
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