Highly oriented boron carbonitride (BCN) nanostructures consisting of nanotubes and nanofibers have been synthesized by bias-assisted hot-filament chemical vapor deposition from the source gases of B2H6, CH4, N2, and H2. It is found that the B concentration of the BCN nanostructures increases with increasing B2H6 in the gas mixture, and the highest B concentration is 45 at. %. Photoluminescence spectrum shows that the BCN nanostructures, identified as B0.34C0.42N0.24, are semiconductors with a band gap energy of around 1.0 eV.
We report the demonstration of a germanium-tin (GeSn) multiple-quantum-well p-i-n photodiode on silicon (Si) substrate for 2 μm-wavelength light detection. Characterization of the photodetector in both direct current (DC) and radio frequency (RF) regimes was performed. At the bias voltage of -1 V, a dark current density of 0.031 A/cm is realized at room-temperature, which is among the lowest reported values for GexSnx-on-Si p-i-n photodiodes. In addition, for the first time, a 3 dB bandwidth (f3dB) of around 1.2 GHz is achieved in GexSnx photodetectors operating at 2 μm. It is anticipated that further device optimization would extend the f3dB to above 10 GHz.
We demonstrate that a complementary metal-oxide-semiconductor (CMOS) compatible silicon (Si) surface passivation technique effectively suppress the dark current originating from the mesa sidewall of the Ge(0.95)Sn(0.05) on Si (Ge(0.95)Sn(0.05)/Si) p-i-n photodiode. Current-voltage (I-V) characteristics show that the sidewall surface passivation technique could reduce the surface leakage current density (Jsurf) of the photodiode by ~100 times. A low dark current density (Jdark) of 0.073 A/cm(2) at a bias voltage of -1 V is achieved, which is among the lowest reported values for Ge(1-x)Sn(x)/Si p-i-n photodiodes. Temperature-dependent I-V measurement is performed for the Si-passivated and non-passivated photodiodes, from which the activation energies of dark current are extracted to be 0.304 eV and 0.142 eV, respectively. In addition, the optical responsivity of the Ge(0.95)Sn(0.05)/Si p-i-n photodiodes to light signals with wavelengths ranging from 1510 nm to 1877 nm is reported.
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