Exoelectron emission from MgO thin film was measured by attaching a high precision current sensor to the address electrode of rear plate of test panels of AC‐PDP. The measured results revealed that the exoelectron emission currents vary very sensitively with the type of doping elements used and measuring temperatures. The activation energy of the exo‐electron emissions estimated from the emission curves indicated that the trap levels lies between 0.05∼0.32eV below the bottom of its conduction band. This suggests that shallow electron trap levels within MgO film are mainly responsible for the exo‐electron emissions, rather than deep trap levels like F‐type centers.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.