This paper presents the X-Hall sensor, a viable sensing architecture for implementing a silicon-integrated, broadband, current/magnetic sensor. The X-Hall sensor overcomes the bandwidth limit of the state-of-the-art Hall sensors by replacing the spinning-current technique with DC-biasedbased, passive offset compensation. In this way, the X-Hall architecture removes the methodological bandwidth limit due to the spinning-current technique and allows for exploiting the Hall probe up to its practical limit, which is set by the parasitic capacitive effects. Moreover, the X-Hall architecture allows to push the practical bandwidth limit at higher frequencies due to both the removal of the switches inherent in the spinning-current approach and a specifically designed analog front-end. To this end, a differential-difference current-feedback amplifier (DDCFA) is proposed as analog front-end in the X-Hall sensor. A prototype of the proposed X-Hall architecture is implemented in BCD 0.16-µm silicon technology to experimentally assess the performance of the X-Hall architecture. The passive offset compensation implemented into the X-Hall architecture is frequency independent and preserves an adequate offset reduction performance, though less efficient than the spinning-current technique operated at low frequency. Experimental dynamic tests on the prototype identify the presence of an additive parasitic dynamic perturbation due to the package that prevents from fully exploiting the X-Hall prototype up to its designed bandwidth limit. However, the implementation of a post de-emphasis digital filter allows to mitigate for the dynamic perturbation and to experimentally achieve a sensor bandwidth of 4 MHz, which is the broadest bandwidth ever demonstrated by a purely Hall-effect based sensor.

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Objective. 3D cell cultures are becoming a fundamental resource for in-vitro studies, as they mimic more closely in-vivo behavior. The analysis of these constructs, however, generally rely on destructive techniques, that prevent the monitoring over time of the same construct, thus increasing the results variability and the resources needed for each experiment. Approach. In this work, we focus on mineralization, a crucial process during maturation of artificial bone models, and propose electrical impedance tomography (EIT) as an alternative non-destructive approach. In particular, we discuss the development of an integrated hardware/software system capable of acquiring experimental data from 3D scaffolds and reconstructing the corresponding conductivity maps. We also show how the same software can test how the measurement is affected by biological features such as scaffold shrinking during the culture. Main results. An initial validation, comprising the acquisition of both a non-conductive phantom and alginate/gelatin scaffolds with known calcium content will be presented, together with the in-silico study of a cell-induced mineralization process. This analysis will allow for an initial verification of the systems functionality while limiting the effects of biological variability due to cell number and activity. Significance. Our results show the potential of EIT for the non-destructive quantification of matrix mineralization in 3D scaffolds, and open to the possible long term monitoring of this fundamental hallmark of osteogenic differentiation in hybrid tissue engineered constructs.

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