An overview is presented of major error sources inherent in the diffraction pattern sampling technique as used for power spectrum measurment. Topics include sampling errors in the measurement of diffraction pattern intensities, the normalization of the data and the interaction of the system limiting aperture with the resulting data.Phase effects and other sources of film noise are also treated. The purpose of this discussion is to acquaint workers in this area with the potential for error and to indicate the need for careful interpretation of the data.
The emphasis in this paper is on frequency domain measures of image quality. The development of a quality measure is illustrated with a series of studies using the optical power spectrum.Relationships with information extraction performance are used to evaluate the effectiveness of the resulting quality measures.The studies cover several image types: conventional photography, CRT display and digitized imagery.The status of physical quality measures, as tools for display development and evaluation, is assessed.
Frequency domain measures of image quality have been used successfully for some years to predict human assessment of image quality. These measures were derived from the optical power spectrum.The emphasis in this paper is on utilization of digitally-derived power spectral estimates of image quality computed before hard copy imagery is produced.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.