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Swift heavy ion (SHI) irradiation experiments have been performed on as-deposited nanocrystalline cadmium sulfide (CdS) thin films by using 100 MeV Au8+ ions with 5 × 1012 ions cm−2. In addition, the as-deposited films were annealed at 300 °C in air for 1 h. Structural, optical and electrical properties of pristine (as-deposited), annealed and irradiated thin films were carried out by using x-ray diffraction (XRD), energy dispersive spectra, scanning electron microscopy, atomic force microscopy, UV-VIS spectroscopy and Arrhenius plots for resistivity and thermoemf, respectively. XRD shows the intrinsic peak of (0 0 2) for the hexagonal phase of CdS. After annealing and SHI irradiation this peak was enhanced drastically and dramatically, showing the dominant orientation in this plane. The grain growth observed in these two post-deposition processes was different. This resulted in a decrease in resistivity of the annealed and the irradiated samples by one and two orders from the pristine sample, respectively.