With technology scaling, integrated circuits suffer from increasingly severe static and dynamic variations, which often manifest themselves as infrequent timing errors on circuit speed paths, if a large timing guard-band is not reserved. This paper presents a new forward timing error correction scheme, namely ForTER, which predicts whether the occurrence of timing errors would propagate to the next level of sequential elements and corrects them without necessarily borrowing timing slack. The proposed technique can be combined with other timing error resilient circuit design techniques to further improve circuit performance, as demonstrated in our experimental results with various benchmark circuits.
We consider the energy needed to separate two surfaces connected by molecular bonds, whose formation and breakage can be described by the classical rate equation. We find that this adhesion energy is strongly rate-dependent due to the chemical kinetics involved. Two cases where the separation between surfaces grows linearly, or exponentially, with respect to time are studied in detail, scaling relations between the adhesion energy and separation speed, or the exponential factor, are derived in each case. As an example of application, the peel test of a membrane in adhesive contact with a substrate is also studied. We will show that findings obtained here can be directly used to predict the relationship between the applied tension and the peeling velocity, which is of central interest to this type of experiment.
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