Deposition of SrTiO3 (STO) thin films by radio-frequency magnetron sputtering in an ultrahigh vacuum system at a low substrate temperature (∼200 °C) was performed in order to produce high-quality STO/p-Si (100) interfaces and STO insulator layers with dielectric constants of high magnitude. The STO films were identified as polycrystalline by x-ray diffraction, and were approximated with a layered structure according to the best fitting results of raw data from both Rutherford backscattering spectroscopy and variable angle spectroscopic ellipsometry. Room-temperature current–voltage and capacitance–voltage (C–V) measurements on Al/STO/p-Si diodes clearly revealed metal–insulator–semiconductor behavior, and the STO/p-Si interface state densities were of the order of 1011 eV−1 cm−2. The dielectric constant of the STO film was 65, and the dielectric loss factor varied between 0.05 and 0.55 for a frequency range of 1 kHz–10 MHz. For a 387 nm thick STO film, the dielectric breakdown field was 0.31 MV cm−1, and the charge storage capacity was 2.1 μC cm−2. These results indicate that STO films are suitable for applications as insulator layers in dynamic random access memories or as cladding layers in electroluminescent devices.
Quantum pattern recognition techniques have recently raised attention as potential candidates in analyzing vast amount of data. The necessity to obtain faster ways to process data is imperative where data generation is rapid. The ever-growing size of sequence databases caused by the development of high throughput sequencing is unprecedented. Current alignment methods have blossomed overnight but there is still the need for more efficient methods that preserve accuracy in high levels. In this work, a complex method is proposed to treat the alignment problem better than its classical counterparts by means of quantum computation. The basic principal of the standard dot-plot method is combined with a quantum algorithm, giving insight into the effect of quantum pattern recognition on pairwise alignment. The central feature of quantum algorithmic -quantum parallelism- and the diffraction patterns of x-rays are synthesized to provide a clever array indexing structure on the growing sequence databases. A completely different approach is considered in contrast to contemporary conventional aligners and a variety of competitive classical counterparts are classified and organized in order to compare with the quantum setting. The proposed method seems to exhibit high alignment quality and prevail among the others in terms of time and space complexity.
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