We present direct observation of self-focusing near the diffraction limit by measuring the beam-spot size with a scanning fiber probe tip. We have used the polycrystalline silicon film, which exhibits a reverse-saturation (Im χ(3)≈8×10−3 esu) and self-focusing (Re χ(3)≈2×10−2 esu), as measured by the conventional z-scan method with He–Ne laser. It is observed that the beam radius of about its wavelength becomes smaller as the input laser intensity is increased, which indicates that the self-focusing effect dominates over the reverse saturation in the 300-nm-thick sample.
The motion of the probe tip in a near-field scanning optical microscope, dithered by vibration of a tuning fork, can modulate the reflection signal from the sample surface not only at the fundamental dithering frequency but also at its second harmonic. By lock-in amplification of these modulated signals, enhanced optical images are obtained, even with an uncoated fiber probe. In particular, accurate optical images with higher resolution are obtained when the second-harmonic signal is detected, which results from the parametric modulation of the tip-sample separation at the double frequency of the horizontal dithering motion of the tip. Using a DVD ROM with a track pitch of 0.74 mum as a test sample, we observed that the sharp edges around the pits are clearly resolved with the second-harmonic signals and obtained enhanced resolution of ~70 nm full width at half-maximum.
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