About 150 nm sized marks were recorded and readout was
performed using a reflection-mode near-field scanning optical
microscope (NSOM) in the 4-layered phase-change optical disk
structure. Full-width at half-maximum (FWHM) values of the linewidth
of the marks recorded at different writing speeds decreased with
increasing writing speed. The thermodynamic stability of the
submicron-sized marks and its implications are discussed on basis of
the surface energy and its effect on the temperature of phase
transformation, including crystallization and melting.
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