Near-Field Optical Study of the Third-Order Nonlinear Properties of Polycrystalline Silicon

Choi, Yunjin; Park, June-H.; Kim, Myong R.; Jhe, Wonho; Jang, Jin; Rhee, Bum Ku

doi:10.3938/jkps.37.688

Cited by 2 publications

(2 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…(6) where the valley is much larger than the peak. The absolute value of (3) χ was calculated from [ ( the nonlinearities of materials such as chalcogenide glasses [33 ], polycrystalline silicon [34] and C60 [16]. The high value may be associated with long-lived excitations of localized states.…”

Section: Third Order Nonlinear Optical Propertiesmentioning

confidence: 99%

Optical characterization of thermally evaporated thin CdO films

Dakhel¹,

Henari

2003

Cryst. Res. Technol.

102

View full text Add to dashboard Cite

Cadmium Oxide films have been prepared by vacuum evaporation method on a glass substrate at room temperature. Detailed structural, optical, and electrical properties of the films are presented at different annealing temperatures. The crystal structure of the samples was studied by X-ray diffraction. The spectral absorption coefficient of the CdO film at the fundamental absorption region (450-650nm) was determined using the spectral data of transmittance. The direct and indirect band gap energies were determined and found to be 2.33 eV and 1.95 eV respectively. The third order optical nonlinearities χ (3) of CdO films has been measured used the z-can technique. The real and imaginary parts of χ (3) have been measured at 514 nm and found to be 1.7x10-3 esu and 3.0x10 -3 esu, respectively.

show abstract

Section: Third Order Nonlinear Optical Propertiesmentioning

confidence: 99%

Optical characterization of thermally evaporated thin CdO films

Dakhel¹,

Henari

2003

Cryst. Res. Technol.

102

View full text Add to dashboard Cite

show abstract

“…By comparing the values of the imaginary and real nonlinearities, one can conclude that Ag-incorporated indium oxide reported here are of the same order of magnitude as the nonlinearities of materials such as chalcogenide glasses, 46 and polycrystalline silicon. 47 Note that there is an increasing trend for the values of , , and ð3Þ as the concentration of the sliver particles increases. This may be attributed to the fact that as the concentration increases, more sliver particles are excited resulting in an enhanced e®ect.…”

Section: Nonlinear Optical Propertiesmentioning

confidence: 94%

Optical and Structural Properties of Silver Nanoparticles Embedded in Indium Oxide Films

Dakhel

Henari

2011

Int. J. Nanosci.

View full text Add to dashboard Cite

Nanoparticles of silver-embedded indium oxide thin¯lms have been prepared on glass and silicon substrates. Silver concentration were 3 wt.% and 5 wt.% as measured by X-ray°uo-rescence. X-ray di®raction reveals that indium oxide of these samples remains amorphous even after pre-annealing at 400 C. The optical absorption of the samples manifests the surface plasmon resonance (SPR) phenomena, which varies with Ag content. The Ag nanoparticles radius was estimated with Mie classical theory by using the SPR data analysis. The nonlinear optical properties of¯lms on glass substrate were investigated using z-scan technique. Under cw excitation the¯lms exhibit large reverse saturation absorption and negative nonlinearities. The real and imaginary parts of third order susceptibility of the samples were measured and the imaginary part which arise from the change in absorption is found to be dominant.

show abstract

Near-Field Optical Study of the Third-Order Nonlinear Properties of Polycrystalline Silicon

Cited by 2 publications

References 0 publications

Optical characterization of thermally evaporated thin CdO films

Optical characterization of thermally evaporated thin CdO films

Optical and Structural Properties of Silver Nanoparticles Embedded in Indium Oxide Films

Contact Info

Product

Resources

About