The reliability of SAC-based solder alloys has been extensively investigated after the prohibition of lead in the electronics industry owing to their toxicity. Low-temperature solder (LTS) alloys have recently received considerable attention because of their low cost and reduced defects in complex assemblies. The shear and fatigue properties of individual solder joints were tested using an Instron micromechanical testing system in this research. Two novel solder alloys (Sn-58Bi-0.5Sb-0.15Ni and Sn-42Bi) with low melting temperatures were examined and compared with Sn-3.5Ag and Sn-3.0Ag-0.8Cu-3.0Bi. The surface finish was electroless nickel-immersion gold (ENIG) during the test. Shear testing was conducted at three strain rates, and the shear strength of each solder alloy was measured. A constant strain rate was used for the cyclic fatigue experiments. The fatigue life of each alloy was determined for various stress amplitudes. The failure mechanism in shear and fatigue tests were characterized using scanning electron microscopy/energy-dispersive spectroscopy (SEM/EDS). The results revealed that Sn-3.0Ag-0.8Cu-3.0Bi had superior shear and fatigue properties compared to other alloys, but was more susceptible to brittle failure. The shear strain rate affected the failure modes of Sn-3.0Ag-0.8Cu-3.0Bi, Sn-58Bi-0.5Sb-0.15Ni, and Sn-42Bi; however, Sn-3.5Ag was found to be insensitive. Several failure modes were detected for Sn-3.5Ag in both shear strength and fatigue tests.

The surface finish (SF) becomes a part of the solder joint during assembly and improves the component’s reliability. Furthermore, the SF influences the solder joint’s reliability by affecting the thickness of the intermetallic compound (IMC) layer at the solder interface and copper pads. In this experiment, five different alloys are used and compared with the SAC305 alloy, two of which, Innolot and SAC-Bi, are bi-based solder alloys. This study includes three common SFs: electroless nickel immersion gold (ENIG), immersion silver (ImAg), and organic solderability preserve (OSP). The performance of three surface finishes is examined in terms of component characteristic life. All of the boards were isothermally aged for twelve months at 125 °C. The boards were then exposed to 5000 cycles of thermal cycling at temperatures ranging from −40–+125 °C. Most of the current research considers only one or two factors affecting the reliability of the electronic package. This study combines the effect of multiple factors, including solder paste content, SF, isothermal aging, and thermal cycling, to ensure that the test conditions represent real-world applications. In addition, the electronics packages are assembled using commercialized alloys. The current study focuses on a high-performance alloy already present in the electronic market. The failure data were analyzed statistically using the Weibull distribution and design of experiments (DOE) analysis of variance (ANOVA) techniques. The findings reveal that the micro and uniformly distributed precipitates in solder microstructures are critical for high-reliability solder joints. Re-crystallization of the thermally cycled solder joints promotes the local formation of numerous new grains in stress-concentrated zones. As the fracture spreads along these grain boundaries and eventually fails, these new grains participate in crack propagation. Aging significantly worsens this situation. Finally, although the ENIG surface finish with its Ni layer outperforms other SFs, this does not imply that ENIG is more reliable in all solder paste/sphere/finish combinations.

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