A test should be reliable and valid enough fbr a test-taker to predict, assess, andlor judge hislher own test perfbrmance immediately afier taking it. Based on this point of view, the present study investigated TOEIC@'s validity from the perspective ofdata on test-takers' post-test-taking psychological attitudes. The investigation involved the
Abstract---A mixed-mode simulator is described that can simulate voltage fluctuations in the power supply network. Current flow due to logic events is taken into account in order to predict the voltage fluctuations. The difference between the maximum voltage fluctuations calculated by the proposed mixed-mode simulation and these calculated by conventional circuit simulation are within 20%, and we demonstrated the feasibility of the proposed simulation by simulating an entire MOS memory chip (36,000 transistors) in 75 minutes on an HP9000/735.
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