Abstract-A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.
We propose a fault tolerance method for torus NoCs capable of increase the yield with minimal performance overhead. The proposed approach consists in detecting and diagnosing interconnect faults using BIST structures and activating alternative paths for the faulty links. Experimental results show that alternative fault-free paths are found by the dynamic routing for 95% of the diagnosed faults (stuck-at and pairwise shorts within a single link or between any two links).
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