In this paper, an in situ power analysis profiling over time for general purpose graphics processing units (GPGPU) is presented. Based on this method the power consumption of different modes of operations like data transfer between GPU and host CPU, basic single precision floating point arithmetic operations (addition, subtraction, multiplication) on the multiprocessor units and instructions for shared and global memory access can be measured. There is a factor of 2 difference in power dissipation between various instructions and mode of operations of the GPGPUs. These measurements provide data for an instruction based power estimation of GPU software. It turns out that the power profile over time also gives a good understanding on which section of the program is executed at a certain point in time. The experimental results have been derived from two GPU architectures, namely the GT200 and the GF100 architecture.

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Optical measurements based on laser light scattering by nanostructures provide fast and contactless measurement of the surface of nanostructures for defects. In this paper, a novel in-process measurement method based on coherent laser light scattering by sub-100-nm structures is presented. It is shown that nanostructure defects can be identified by their unique scattering pattern. This is investigated by using modified algorithms of the discrete dipole approximation (DDA). Also hardware acceleration of the DDA algorithm on a General Purpose Graphical Processing Unit (GPGPU) platform shows a speedup of a factor of 5 over a high end CPU based platform.