We analyze the propagating optical modes in a Silicon membrane photonic crystal waveguide, based on subwavelength-resolution amplitude and phase measurements of the optical fields using a heterodyne near-field scanning optical microscope (H-NSOM). Fourier analysis of the experimentally obtained optical amplitude and phase data permits identification of the propagating waveguide modes, including the direction of propagation (in contrast to intensity-only measurement techniques). This analysis reveals the presence of two superposed propagating modes in the waveguide. The characteristics of each mode are determined and found to be consistent with theoretical predictions within the limits of fabrication tolerances. An analysis of the relative amplitudes of these two modes as a function of wavelength show periodic oscillation with a period of approximately 3.3 nm. The coupling efficiency between the ridge waveguide and the photonic crystal waveguide is also estimated and found to be consistent with the internal propagating mode characteristics. The combination of high-sensitivity amplitude and phase measurements, subwavelength spatial resolution, and appropriate interpretive techniques permits the in-situ observation of the optical properties of the device with an unprecedented level of detail, and facilitates the characterization and optimization of nanostructure-based photonic devices and systems.
A study of the optical properties of microfabricated, fully-metal-coated quartz probes collecting longitudinal and transverse optical fields is presented. The measurements are performed by raster scanning the focal plane of an objective, focusing azimuthally and radially polarized beams by use of two metal-coated quartz probes with different metal coatings. A quantitative estimation of the collection efficiencies and spatial resolutions in imaging both longitudinal and transverse fields is made. Longitudinally polarized fields are collected with a resolution approximately 1.5 times higher as compared with transversely polarized fields, and this behavior is almost independent of the roughness of the probe's metal coating. Moreover, the coating roughness is a critical parameter in the relative collection efficiency of the two field orientations.
Fully metal-coated near-field optical probes, based on a cantilever design, have been studied theoretically and experimentally. Numerical simulations prove that these structures allow nonzero modal emission of the electromagnetic field through a 60-nm-thick metallic layer, that is opaque when deposited on flat substrates. The far-field intensity patterns recorded experimentally correspond to the ones calculated for the fundamental and first excited LP modes. Moreover, this study demonstrates that a high confinement of the electromagnetic energy can be reached in the near-field, when illuminated with radially polarized light. Finally, it was verified that the confinement of the field depends on the volume of the probe apex.Nearly 20 years of intensive research in near-field optical microscopy have produced satisfying results in imaging and subwavelength resolution. 1
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