Currently, the performances of thin film solar cells are limited by poor light absorption and carrier collection. In this research, large, broadband, and polarization-insensitive light absorption enhancement was realized via integrating with unique metallic nanogratings. Through simulation, three possible mechanisms were identified to be responsible for such an enormous enhancement. A test for totaling the absorption over the solar spectrum shows an up to approximately 30% broadband absorption enhancement when comparing to bare thin film cells.
We report a 50% increase in the power conversion efficiency of InAs/GaAs quantum dot solar cells due to n-doping of the interdot space. The n-doped device was compared with GaAs reference cell, undoped, and p-doped devices. We found that the quantum dots with built-in charge (Q-BIC) enhance electron intersubband quantum dot transitions, suppress fast electron capture processes, and preclude deterioration of the open circuit voltage in the n-doped structures. These factors lead to enhanced harvesting and efficient conversion of IR energy in the Q-BIC solar cells.
High barrier Yb/p-InP metal-insulator-semiconductor (MIS) and metal-semiconductor (MS) junctions were fabricated by evaporation of Yb on InP:Zn substrates. The capacitance-voltage (C-V) and current-voltage (I-V) characteristics of these devices were measured over a wide range of temperatures. From the room-temperature forward I-V data, the values of 1.06 and 1.30 for the ideality factor (n) were obtained for the MIS and MS diodes, respectively. The higher value of n was attributed to an order of magnitude higher density of interface states in the MS junction than in the MIS diodes. The I-V/T data over the temperature range 190–400 K, indicated that the forward current transport in the Yb/p-InP MIS junction was controlled by the thermionic-field emission (TFE) mechanism. The analysis of the reverse saturation current I0 in terms of the TFE model provided a value of 1.07±0.03 V for the zero bias, zero temperature barrier height (φ0) which was in close agreement with the value of φ0=1.03±0.04 V, provided by the C-V data. For the MS diode, the temperature dependence of the forward I-V characteristics over the temperature range 250–350 K were well described by the thermionic emission process. However, the value of φ0=0.80±0.04 V, determined from the I-V data was much smaller than the value of φ0=0.96±0.04 V, obtained from the C-V data.
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