Studies of micro-cutting have so far largely been carried out on single-phase materials. Due to the size effect, the workpiece material microstructure can have a significant influence on the cutting force, chip formation and surface quality. Previous investigations have shown that hard particles in materials such as aluminum alloy can play a significant role in the generation of defects such as cracks and voids on the work surface. This paper will examine the extent of the problem during the micro-cutting of Al6061 T6 and propose how it can be mitigated.
High-electric-field phenomena above 1 MV/cm in a-Si:H have been investigated using an ac-driven double-insulating electroluminescent device structure. An emission tailing into energies above the optical energy gap has been observed, giving direct evidence for the existence of hot electrons in a-Si:H generated by an electric field. An analysis of the emission spectrum indicates an average energy of 0.13 eV and a mean free path of 1.0 nm for hot electrons. Electroabsorption reveals that the internal electric field in a-Si:H saturates at about 1.2–1.5 MV/cm, which implies multiplication of charges transferred across the a-Si:H layer at this field strength. Experimental data suggest avalanche multiplication due to field-induced hot electrons.
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