We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two major issues are addressed. (1) The oscillation ring (OR) test and its diagnosis scheme for interconnect based on the popular IEEE P1500 are integrated into the multilevel routing framework to achieve testability enhancement. We augment the traditional multilevel framework of coarsening followed by uncoarsening by introducing a preprocessing stage that analyzes the oscillation ring structure for better resource estimation before the coarsening stage, and a final stage after uncoarsening that improves testability to achieve 100% interconnect fault coverage and maximal diagnosability. (2) We present a heuristic to balance routing congestion to optimize the multiple-fault probability, chemical mechanic polishing (CMP) and optical proximity correction (OPC) induced manufacturability, and crosstalk effects, for yield improvement. Experimental results on the MCNC benchmark circuits show that the proposed OR method achieves 100% fault coverage and the maximal diagnosis resolution for interconnects, and the multilevel routing algorithm effectively balances the routing density to achieve 100% routing completion. Compared with [24], the experimental results show that our router improves the maximal congestion by 1.24X--6.11X in runtime speedup by 1.08X--7.66X, and improves the average congestion by 1.00X--4.52X with the improved congestion deviation by 1.37X--5.55X.
Abstract-An interconnect diagnosis scheme based on the oscillation ring (OR) test methodology for systems-on-chip (SOC) design with heterogeneous cores is proposed. In addition to traditional stuck-at and open faults, the OR test can also detect and diagnose important interconnect faults such as delay faults and crosstalk glitches. The large number of test rings in the SOC design, however, significantly complicates the interconnect diagnosis problem. In this paper, the diagnosability of an interconnect structure is first analyzed then a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm are proposed. It is shown in this paper that the generation algorithm achieves the maximum diagnosability for any interconnect. Two optimization techniques are also proposed, an adaptive and a concurrent diagnosis method, to improve the efficiency and effectiveness of interconnect diagnosis. Experiments on the MCNC benchmark circuits show the effectiveness of the proposed diagnosis algorithms. In all experiments, the method achieves 100% fault detection coverage and the optimal interconnect diagnosis resolution.
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