Structural distortions of the surface layer of Si single crystals implanted by monoenergetic Au ions (ion energy 120 keV and 180 keV, doses 1013 ions/cm2 and 2 × 1014 ions/cm2, respectively) are studied by X‐ray diffraction. Traverse‐type topographs are obtained by Lang's method. A method to determine the thickness of the distorted layer using interference pattern contrast measurements is suggested.
Two-wave dynamical diffraction of an X-ray spherical wave in a crystal, when the wave passes through an object with a periodic amplitude transmission function, is considered. The behavior of the diffracted wave (spherical-wave Talbot effect) in the crystal is investigated. The Talbot effect inside the crystal is accompanied by the focusing effect and the pendulum effect. Peculiarities of the effect before the focus point, in the focusing plane and in the region after the focus point inside the crystal are revealed. An expression is found for the Talbot depth and the spherical-wave Talbot effect in these three regions is investigated. The spherical-wave dynamical diffraction Talbot effect in a crystal is compared with the classical spherical-wave Talbot effect and also with spherical-wave effects inside the crystal without a periodic object.
The influence of dilatation and defocusing on interference lines obtained with LLL interferometers having different-thickness mirror blocks is studied both theoretically and experimentally. These interference lines are known to be V-shaped. It is shown that the vertices of V-shaped bands are displaced along the direction of the diffraction vector and of the normal to the scattering plane. TeOpeTliYeCKHu3KCnepaMeHTanbHOHCCneAOBaHOBnuRHuenunaTa~aeIIAe@OKyCapOBKHHaHHTep@e-P e W H O H H b K JIHHHH, IIOJIyYeHHble OT Ann HHTep@epOMeTpOB C PX%HOTO.MLIHHHbIMH 3epKWlbHblMH 6nOKaMM. 3 T H HHTep@epeHUHOHHbIe J H H H H , KBK H3BeCTHO HMeIOT V-oGpas~ym @OpMY. nOKa3aH0, TO BepuruHbI V-06pa3~b1x nonoc npeTepneBamT CMeuesim no HanpaanerImo BeKTopa nu@parquu H no HOpManU nnOCKOCTH PaCIXflHHfl.
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