Storage of speckle pattern in real time by means of Bit2SiO2o-crystals will be reported. Applying the double exposure technique, deformations, displacements as well as tilts can be analysed. The novel speckle technique displays the Young'-interference fringes in quasi real time.
Vibration analysis in quasi-real time is studied by recording the time-averaged speckle pattern in a bismuth silicon oxide crystal (Bi 12 Si020). When the crystal is illuminated with a spherical wave, the spatially structured information from the time-averaged speckle pattern leads to fringes in the Fraunhofer plane. No storage device is required when the appropriate wavelength is chosen for writing and reading out the information. Experimental results will be presented together with a comparison of measurements obtained with a Doppler shift vibrometer.
Holographic interferometry and speckle application are powerful techniques for deformation, displacement and vibration analysis especially when they can be applied in real time. Bismuth Silicon Oxide crystals 8i,2 51 020 (850) were used for real-time deformatio~ displacement and vibration analysis using holog~aphy and ~speckle photography". Af ter a short introduction of holographic interferometry for deformation measurement using sso crystals. speckle applications for deformation, displacement and vibration analysis in real tLIDe will be discussed.
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