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Power consumption during scan testing is becoming a concern. Circuit switching activity during scan shifting is high and results in high average and instantaneous power consumption. This paper presents a scheme for reducing power and provides analysis results on an industrial design.

The semiconductor industry as a whole is growing increasingly concerned about the possible presence of delay-inducing defects. There exist structured test generation and application techniques which can detect them, but there are many practical issues associated with their use. These problems are particularly acute when using low cost test equipment. In this paper, we describe an overall approach for implementing scan-based delay testing with emphasis on low-cost test.

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