In order to investigate band gap tunability in polar oxides, we measured the optical properties of a series of Bi͑Fe 1−x Mn x ͒O 3 thin films. The absorption response of the mixed metal solid solutions is approximately a linear combination of the characteristics of the two end members, a result that demonstrates straightforward band gap tunability in this system.

Phase-pure, stoichiometric, unstrained, epitaxial ͑001͒-oriented EuTiO 3 thin films have been grown on ͑001͒ SrTiO 3 substrates by reactive molecular-beam epitaxy. Magnetization measurements show antiferromagnetic behavior with T N = 5.5 K, similar to bulk EuTiO 3. Spectroscopic ellipsometry measurements reveal that EuTiO 3 films have a direct optical band gap of 0.93Ϯ 0.07 eV.

We report the growth of ultrathin VO 2 films on rutile TiO 2 (001) substrates via reactive molecular-beam epitaxy. The films were formed by the cyclical deposition of amorphous vanadium and its subsequent oxidation and transformation to VO 2 via solid-phase epitaxy.Significant metal-insulator transitions were observed in films as thin as 2.3 nm, where a resistance change ΔR/R of 25 was measured. Low angle annular dark field scanning transmission electron microscopy was used in conjunction with electron energy loss spectroscopy to study the film/substrate interface and revealed the vanadium to be tetravalent and the titanium interdiffusion to be limited to 1.6 nm. Page 4 of 25The huge metal-insulator transition (MIT) exhibited by VO 2 in the vicinity of roomtemperature has made it a material of interest for uncooled microbolometer arrays, 1 gas sensing, 2 optical limiting, 3 and most recently MIT transistors. 4,5 In bulk single crystals this MIT occurs at a transition temperature (T c ) of 340 K and is accompanied by a change in structure from a hightemperature tetragonal form, to a low-temperature monoclinic form. 6 The change in resistivity through this transition in bulk VO 2 single crystals has been measured to be five orders of magnitude with a temperature hysteresis 0.5-1 K. 7 The change in resistivity in thick films (>100 nm) can be as high as four orders of magnitude, [8][9][10] but in thin films (<10 nm) is less than three orders of magnitude in all reports to date. 11-13While VO 2 presents an opportunity for emergent switching devices and sensors, its large carrier concentration (~10 In this paper we describe a process for the growth of ultrathin VO 2 films by reactive molecular-beam epitaxy (MBE) and show that they exhibit clear MITs in films as thin as 2.3 nm.We investigate the properties of these films with four-circle x-ray diffraction (XRD), low-angle annular dark field (LAADF) scanning transmission electron microscopy (STEM), electron energy loss spectroscopy (EELS), and electronic transport measurements. We also describe a standardized method for calculating the magnitude, hysteresis, and T c of these transitions using Savitsky-Golay smoothing derivatives. 16 All films in this paper were grown by MBE in a Veeco Gen10. X-ray diffraction spectra were collected with a Rigaku Smartlab system utilizing Cu Κ α1 radiation with a 220 Ge twobounce incident-beam monochromator and a 220 Ge two-bounce diffraction side analyzer crystal. STEM images were taken with an FEI Tecnai G 2 F20. VO 2 film thicknesses were calculated with data from Rutherford backscattering spectrometry (RBS) assuming the calibration films had bulk VO 2 density. Electrical transport data was taken using the standard four-contact van der Pauw method in a Quantum Design Physics Property Measurement System (PPMS) with contacts made using gold wire and silver paint. All growth temperatures were measured using a thermocouple in the substrate cavity, but not in contact with the substrate.During growth the film was monitored using reflection ...

Lee, J. H.; Ke, X.; Misra, R.; Ihlefeld, J. F.; Xu, X. S.; Mei, Z. G.; Heeg, T.; Roeckerath, M.; Schubert, J.; Liu, Z. K.; Musfeldt, J. L.; Schiffer, P.; and Schlom, D. G., "Adsorption-controlled growth of BiMnO3 films by molecular-beam epitaxy" (2010).

A thin dielectric resonator consisting of a dielectric substrate and the thin film deposited upon it is shown to suffice for microwave characterization and dielectric parameter measurement of high-permittivity thin films without electrodes. The TE01δ resonance mode was excited and measured in thin (down to 0.1 mm) rectangular- or disk-shaped low-loss dielectric substrates (D∼10 mm) with permittivity ε′≥10 inserted into a cylindrical shielding cavity or rectangular waveguide. The in-plane dielectric permittivity and losses of alumina, DyScO3, SmScO3, and (LaAlO3)0.29(SrAl1/2Ta1/2O3)0.71 (LSAT) substrates were measured from 10 to 18 GHz. The substrate thickness optimal for characterization of the overlying thin film was determined as a function of the substrate permittivity. The high sensitivity and efficiency of the method, i.e., of a thin dielectric resonator to the dielectric parameters of an overlying film, was demonstrated by characterizing ultrathin strained EuTiO3 films. A 22 nm thick EuTiO3 film grown on a (100) LSAT substrate and strained in biaxial compression by 0.9% exhibited an increase in microwave permittivity at low temperatures consistent with it being an incipient ferroelectric; no strain-induced ferroelectric phase transition was seen. In contrast, a 100 nm thick EuTiO3 film grown on a (110) DyScO3 substrate and strained in biaxial tension by 1% showed two peaks as a function of temperature in microwave permittivity and loss. These peaks correspond to a strain-induced ferroelectric phase transition near 250 K and to domain wall motion.

This paper describes an integrated approach to developing a predictive computer model for long-term performance of concrete engineered barriers utilized in LLRW and ILRW disposal facilities. The model development concept consists of three major modeling schemes: hydration modeling of the binder phase, pore solution speciation, and transport modeling in the concrete barrier and service environment. Although still in its inception, the model development approach demonstrated that the chemical and physical properties of complex cementitious materials and their interactions with service environments can be described quantitatively.Applying the integrated model development approach to modeling alkali (Na and K) leaching from a concrete pad barrier in an above-grade tumulus disposal unit, it is predicted that, in a near-surface land disposal facility where water infiltration through the facility is normally minimal, the alkalis control the pore solution pH of the concrete barriers for much longer than most previous concrete barrier degradation studies assumed. The results also imply that a highly alkaline condition created by the alkali leaching will result in alteration of the soil mineralogy in the vicinity of the disposal facility.

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