In order to improve the image quality of the aerial optoelectronic sensor over a wide range of temperature changes, high thermal adaptability of the primary mirror as the critical components is considered. Integrated optomechanical analysis and optimization for mounting primary mirrors are carried out. The mirror surface shape error caused by uniform temperature decrease was treated as the objective function, and the fundamental frequency of the mirror assembly and the surface shape error caused by gravity parallel or vertical to the optical axis are taken as the constraints. A detailed size optimization is conducted to optimize its dimension parameters. Sensitivities of the optical system performance with respect to the size parameters are further evaluated. The configuration of the primary mirror and the flexure are obtained. The simulated optimization results show that the size parameters differently affect the optical performance and which factors are the key. The mirror surface shape error under 30 °C uniform temperature decrease effectively decreased from 26.5 nm to 11.6 nm, despite the weight of the primary mirror assembly increases by 0.3 kg. Compared to the initial design, the value of the system’s modulation transfer function (0° field angle) is improved from 0.15 to 0.21. Namely, the optical performance of the camera under thermal load has been enhanced and thermal adaptability of the primary mirror has been obviously reinforced after optimization. Based on the optimized results, a prototype of the primary mirror assembly is manufactured and assembled. A ground thermal test was conducted to verify difference in imaging quality at room and low temperature, respectively. The image quality of the camera meets the requirements of the index despite degrading.
Single-event effects (SEEs) in integrated circuits and devices can be studied by utilizing ultra-fast pulsed laser system through Two Photon Absorption process. This paper presents technical ways to characterize key factors for laser based SEEs mapping testing system: output power from laser source, spot size focused by objective lens, opening window of Pockels cell, and calibration of injected laser energy. The laser based SEEs mapping testing system can work in a stable and controllable status by applying these methods. Furthermore, a sensitivity map of a Static Random Access Memory (SRAM) cell with a 65 nm technique node was created through the established laser system. The sensitivity map of the SRAM cell was compared to a map generated by a commercial simulation tool (TFIT), and the two matched well. In addition, experiments in this paper also provided energy distribution profile along Z axis that is the direction of the pulsed laser injection and threshold energy for different SRAM structures.
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