Testing of a newly developed position sensitive high count rate microstrip gas chamber (MSGC) detector at high count rate operation has been carried out at the Dutch–Belgian x-ray scattering beamline at the European Synchrotron Radiation Facility (Grenoble, France) with a high intensity x-ray beam. The measurements show local count rate capabilities up to ∼4.5×105 counts/s/channel. Experimental data taken with this detector are also shown. These tests show that both time resolution down to 1.5 ms/frame and a reliable operation at high counting rates can be achieved.
A sample manipulator with six degrees of freedom, which is part of a molecular beam scattering apparatus used to study gas - surface interactions, is described. Incidence parameters such as the angle of incidence and the azimuthal angle can be set and particles leaving the surface both in and out the plane of incidence can be measured (to within accuracy). The latter is achieved, under computer control, by a combination of the movement of the manipulator and the movement of the detector. Cooling of the sample to liquid temperatures and heating to at least 1600 K is possible. A mathematical relation among the positions of the manipulator and of the detector, the required incidence angle of the particles and the final angle of the scattered particles to be measured is derived.
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