International audienceAn experimental and numerical study of the laser-induced damage of the surface of optical materialin the femtosecond regime is presented. The objective of this work is to investigate the differentprocesses involved as a function of the ratio of photon to bandgap energies and compare the resultsto models based on nonlinear ionization processes. Experimentally, the laser-induced damagethreshold of optical materials has been studied in a range of wavelengths from 1030 nm (1.2 eV) to310 nm (4 eV) with pulse durations of 100 fs with the use of an optical parametric amplifier system.Semi-conductors and dielectrics materials, in bulk or thin film forms, in a range of bandgap from 1to 10 eV have been tested in order to investigate the scaling of the femtosecond laser damagethreshold with the bandgap and photon energy. A model based on the Keldysh photo-ionizationtheory and the description of impact ionization by a multiple-rate-equation system is used toexplain the dependence of laser-breakdown with the photon energy. The calculated damage fluencethreshold is found to be consistent with experimental results. From these results, the relativeimportance of the ionization processes can be derived depending on material properties and irradiationconditions. Moreover, the observed damage morphologies can be described within the frameworkof the model by taking into account the dynamics of energy deposition with one dimensionalpropagation simulations in the excited material and thermodynamical considerations

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In this study, the applicability of commonly used Damage Frequency Method (DFM) is addressed in the context of Laser-Induced Damage Threshold (LIDT) testing with pulsed lasers. A simplified computer model representing the statistical interaction between laser irradiation and randomly distributed damage precursors is applied for Monte Carlo experiments. The reproducibility of LIDT predicted from DFM is examined under both idealized and realistic laser irradiation conditions by performing numerical 1-on-1 tests. A widely accepted linear fitting resulted in systematic errors when estimating LIDT and its error bars. For the same purpose, a Bayesian approach was proposed. A novel concept of parametric regression based on varying kernel and maximum likelihood fitting technique is introduced and studied. Such approach exhibited clear advantages over conventional linear fitting and led to more reproducible LIDT evaluation. Furthermore, LIDT error bars are obtained as a natural outcome of parametric fitting which exhibit realistic values. The proposed technique has been validated on two conventionally polished fused silica samples (355 nm, 5.7 ns).