Transaction-level modeling (TLM) has been proposed as the leading strategy to address the always increasing complexity of digital systems. However, its introduction arouses a new challenge for designers and verification engineers, since there are no mature tools to automatically synthesize an RTL implementation from a transaction-level (TL) design, thus manual refinements are mandatory. In this context, the paper presents an incremental assertionbased verification (ABV) methodology to check the correctness of the TL-to-RTL refinement. The methodology relies on reusing assertions and already checked code, and it is guided by an assertion coverage metrics.

Mutation analysis is a widely-adopted strategy in software testing with two main purposes: measuring the quality of test suites, and identifying redundant code in programs. Similar approaches are applied in hardware verification and testing too, especially at RTL or gate level, where mutants are generally referred as faults, and mutation analysis is performed by means of fault modeling and fault simulation. However, in modern embedded systems there is a close integration between HW and SW parts, and verification strategies should be applied early in the design flow. This requires the definition of new mutation analysis-based strategies that work at system level, where HW and SW functionalities are not partitioned yet. In this context, the paper proposes a mutation model for perturbing transaction level modeling (TLM) SystemC descriptions. In particular, the main constructs provided by the SystemC TLM 2.0 library have been analyzed, and a set of mutants is proposed to perturb the primitives related to the TLM communication interfaces. Related worksSeveral approaches [8-13], empirical studies [14] and frameworks [15, 16] have been presented in the literature for 978-3-9810801-3-1/DATE08

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The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, even formal, specification of the device driver functionalities. In the systemlevel design, IP functionalities are tested by using testbenches, implemented to contain the communication protocols to correctly interact with the device. The aim of this paper is to present a methodology to automatically generate device drivers from the testbench of any RTL IP. The only manual step required is to tag the states corresponding to the different device functionalities. The Extended Finite State Machines (EFSMs) are then used to create a correct-by-construction two-level device driver: the lower level deals with architectural choices, while the higher one is derived from the EFSMs and it implements the communication protocols. The effectiveness of this methodology has been proved by applying it to a platform provided by STMicroelectronics.

The topic will cover the use of functional qualification for measuring the quality of functional verification of TLM models. Functional qualification is based on the theory of mutation analysis but considers a mutation to have been killed only if a testcase fails. A mutation model of TLM behaviors is proposed to qualify a verification environment based on both testcases and assertions. The presentation describes at first the theoretic aspects of this topic and then it focuses on its application to real cases by using actual EDA tools, thus showing advantages and limitations of the application of mutation analysis to TLM.