Nondestructive quality inspection with terahertz waves has become an emerging technology, especially in the automotive and aviation industries. Depending on the specific application, different terahertz systems-either fully electronic or based on optical laser pulses-cover the terahertz frequency region from 0.1 THz up to nearly 10 THz and provide high-speed volume inspections on the one hand and high-resolution thickness determination on the other hand. In this paper, we present different industrial applications, which we have addressed with our terahertz systems within the last couple of years. First, we show three-dimensional imaging of glass fiber-reinforced composites and foam structures, and demonstrate thickness determination of multilayer plastic tube walls. Then, we present the characterization of known and unknown multilayer systems down to some microns and the possibility of measuring the thickness of wet paints. The challenges of system reliability in industrial environments, e.g., under the impact of vibrations, and effective solutions are discussed. This paper gives an overview of state-of-the-art terahertz technology for industrial quality inspection. The presented principles are not limited to the automotive and aviation industries but can also be adapted to many other industrial fields.

We present time-resolved cyclotron resonance spectra of holes in p-Ge measured during single magnetic field pulses by using a rapid-scanning, fiber-coupled terahertz time-domain spectroscopy system. The key component of the system is a rotating monolithic delay line featuring four helicoid mirror surfaces. It allows measurements of THz spectra at up to 250 Hz repetition rate. Here we show results taken at 150 Hz. In a single 900 ms measurement 135 cyclotron resonance spectra were recorded that fully agree with what is expected from literature.

Photonic terahertz (THz) technology using femtosecond (fs) lasers has a great potential in a wide range of applications, such as non-destructive testing of objects or spectroscopic identification of chemical substances. For industrial purposes, a THz system has to be compact and easily implementable into the particular application. Therefore, fiber-coupled THz systems are the key to a widespread use of THz technology. In order to have flexible THz emitters and detectors near infrared fs light pulses have to be sent through optical fibers of considerable length. As a consequence, the fiber's dispersion has to be compensated for and nonlinear effects in the fiber have to be minimized. A fiber-based THz time-domain spectroscopy system of high stability, flexibility, and portability is presented here.

We present results on the comparison of different THz technologies for the detection and identification of a variety of explosives from our laboratory tests that were carried out in the framework of NATO SET-193 THz technology for stand-off detection of explosives: from laboratory spectroscopy to detection in the field under the same controlled conditions. Several laser-pumped pulsed broadband THz time-domain spectroscopy (TDS) systems as well as one electronic frequency-modulated continuous wave (FMCW) device recorded THz spectra in transmission and/or reflection. © 2014 SPIE

Terahertz time-domain spectroscopy as well as all optical pump-probe techniques with ultrashort pulses relies on the exact knowledge of an optical delay between related laser pulses. Classical realizations of the measurement principle vary the optical path length for one of the pulses by mechanical translation of optical components. Most commonly, only an indirect measurement of the translation is carried out, which introduces inaccuracies due to imprecise mechanics or harsh environment. We present a comprehensive study on the effect of delay inaccuracies on the quality of terahertz spectra acquired with time-domain spectroscopy systems and present an interferometric technique to directly acquire the optical delay simultaneously to the terahertz measurement data. This measurement principle enables high-precision terahertz spectroscopy even in harsh environment with non-systematic disruptions.

We present in this paper spectral and spatial characteristics of terahertz emission from standard dipole antenna structures used as emitters depending on the substrate material. All antenna structures were lithographically fabricated on low-temperature (LT) grown, few-micrometers-thick gallium arsenide (GaAs) layers. To investigate the effect of the substrate material on the radiation pattern of terahertz beams, either semi-insulating gallium arsenide or high-resistivity silicon substrate wafers have been used. As detector a standard 40 µm long dipole antenna on a semi-insulating GaAs substrate with a low-temperature grown gallium arsenide layer on it has been employed; this configuration allows for broadband detection and is still efficient enough for the characterization purpose. Strong dependence of the radiation pattern on the substrate used for the terahertz source is demonstrated. The measured patterns and differences between the two cases of substrates are well explained by means of classical diffraction.

Concerning several attacks using letter bombs within Europe in the last couple of years and the highly rising number of new drugs, there is a need for new kinds of detection devices for explosives and drugs. We present a postscanner on basis of Terahertz (THz) spectroscopy using novel chemometric methods for the evaluation of detected THz fingerprints

The quality of coatings in industrial applications and scientific research with thicknesses in the micrometer range is an important criterion for quality management. Therefore, thickness determination devices are of high interest. Terahertz time-domain spectroscopy systems have demonstrated the capability to address thickness determination of dielectric single-and multilayer coatings on different substrates. However, due to the large range of different samples, there are different performance requirements to ensure a high-quality determination result. In this paper, we investigate the influence of system parameters-bandwidth and dynamic range-on thickness determination performance for a single-layer coating on metal substrates with thicknesses from 0.5 to 100 pm, based on measurements and numerical calculations within dynamic ranges from 10 to 90 dB and bandwidths from 1.5 to 10 THz.