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Significantly enhanced anisotropic magnetoresistance (MR) in permalloy (Ni0.81Fe0.19) films deposited on a thin (Ni0.81Fe0.19)1−xCrx or Ni1−xCrx underlayer is reported. The maximum ΔR/R enhancement was observed using the underlayer with x≈0.44 at an optimum thickness of ≈30–45 Å, depending on the deposition technique. An enhancement of 75%–150% was observed for 45–430 Å thick permalloy films, compared to the films deposited without this underlayer. The ΔR/R enhancement is attributed to the decrease in the resistivity ρ and the increase in Δρ of the permalloy film due to the formation of large (111) textured crystal grains in the permalloy films deposited on this underlayer, as revealed by the x-ray diffraction results obtained using synchrotron radiation.

SAXSMorph is a free computer analysis program that generates three‐dimensional representative morphologies of two‐phase systems using small‐angle X‐ray or neutron scattering data. The morphologies thus generated have the correct length scales and degree of connectivity with respect to the sample and are a useful visualization tool. The program also offers statistical analysis of the generated morphology. SAXSMorph is written in Java and is user friendly and platform independent.

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