Patterns useful for identification are obtained by automated diffractometer methods. The lattice constants from the experimental work are refined by least-squares methods; reflections are assigned hkℓ indices consistent with space group extinctions. Relative intensities, calculated densities, literature references, and other relevant data are included.

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).The data for each phase apply to the specific sample described. A sample was mixed with 1 or 2 internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Forty-six standard X-ray diffraction powder patterns are presented. Fourteen are to replace twelve patterns already given in the X-ray Powder Data File, and thirty-four are for substances not previously included. The X-ray Powder Data File is a compilation of diffraction patterns from many sources and is used for the identification of unknown crystalline materials by matching spacing and intensity measurements. The patterns were made with a Geiger counter X-ray diffractometer, using samples of high purity. The d-values were assigned Miller indices determined by comparison with calculated interplanar spacings and from space group considerations. The densities and lattice constants were calculated, and the refractive indices were measured whenever possible.

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

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