Standard x-ray diffraction powder patterns

Abstract

Forty-six standard X-ray diffraction powder patterns are presented. Fourteen are to replace twelve patterns already given in the X-ray Powder Data File, and thirty-four are for substances not previously included. The X-ray Powder Data File is a compilation of diffraction patterns from many sources and is used for the identification of unknown crystalline materials by matching spacing and intensity measurements. The patterns were made with a Geiger counter X-ray diffractometer, using samples of high purity. The d-values were assigned Miller indices determined by comparison with calculated interplanar spacings and from space group considerations. The densities and lattice constants were calculated, and the refractive indices were measured whenever possible.

Laser‐Based Additive Manufacturing of WC–Co with High‐Temperature Powder Bed Preheating†

“…The phase α‐W 2 C was also found by Gläser using electron backscatter diffraction measurements and by Schubert et al using EDS. The signal of cubic β‐Co (51.8°, 60.6°) disappears in LPBF samples. In the same time, a higher amount of hexagonal α‐Co (57°) is observed .…”

Temperature‐dependent Raman scattering studies of Na2MoO4

“…4,5 Since this structure is face-centered, the primitive cell comprises only two formula units and the factor group analysis leads to 39 k D 0 optical modes and 3 acoustic modes. The optical modes are distributed among the irreducible representations of the factor group O h as follows:…”

Photocatalytic Lithography with Atomic Layer–Deposited TiO2 Films to Tailor Biointerface Properties

“…The 10 and 20 nm TiO 2 layers deposited at 250 °C display multiple clear diffraction peaks, all corresponding to synthetic anatase TiO 2. No diffraction peaks of rutile TiO 2 were observed. The increase in peak intensity between 10 and 20 nm can also be attributed to a larger volume of crystalline grains present in the 20 nm TiO 2 film in addition to an increase in thickness of the coating.…”