This paper analyses the effects of single-event transients (SETs) on CMOS low noise amplifiers (LNA) designed for a 0.18 mm technology. Two well-known topologies, the common-source and common-gate cascodes, have been analysed when heavy ions strike the most sensitive nodes of these structures. In order to simulate these strikes both a physics-based technology computer aided design (TCAD) tool and an electrical circuit domain simulator have been used. This way the physics information given by the TCAD tool is combined with the fast transient simulations performed in circuit simulators. To study their SET performance, the maximum voltage peak and the recovery time of the output signal were calculated for both LNAs. Additionally, a safe operating area can be defined, setting the boundaries for acceptable SETs. Radiation hardening by design techniques have been applied at the most vulnerable nodes of both LNAs. The proposed mitigation approaches make both LNAs hardened against radiation, considerably improving their SET performance.

This paper presents a low power 2.4 GHz receiver front-end for 2.4-GHz-band IEEE 802.15.4 standard in 0.18 µm CMOS technology. This receiver adopts a low-IF architecture and comprises a variable gain single-ended low-noise amplifier (LNA), a quadrature passive mixer, a variable gain transimpedance amplifier (TIA) and a complex filter for image rejection. The receiver front-end achieves 42 dB voltage conversion gain, 10.3 dB noise figure (NF), 28 dBc image rejection and -5 dBm input third-order intercept point (IIP3). It only consumes 5.5 mW. Index terms: RF front end, CMOS RFIC, IEEE 802.15.4 receiver, low-noise amplifier (LNA), passive quadrature mixer, complex filter.

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In this paper, an area-efficient 4-stage dual-fed distributed power amplifier (DPA) implemented in a 0.35 μm Complementary Metal Oxide Semiconductor (CMOS) process is presented. To effectively reduce the area of the circuit, techniques such as using multilevel inductors and closely-placing conventional spiral inductors are employed. Additionally, a novel technique based on stacking inductors one on top of others is implemented. Based on these techniques, a 32% area reduction is achieved compared to a conventional design without a noticeable performance degradation. This reduction could be further exploited as the number of stages of the dual-fed DPA increases.

This paper presents a procedure to analyse the effects of radiation in an IEEE 802.15.4 RF receiver for wireless sensor networks (WSNs). Specifically, single-event transients (SETs) represent one of the greatest threats to the adequate performance of electronic communication devices in high-radiation environments. The proposed procedure consists in injecting current pulses in sensitive nodes of the receiver and analysing how they propagate through the different circuits that form the receiver. In order to perform this analysis, a Complementary Metal Oxide Semiconductor (CMOS) low-IF receiver has been designed using a 0.18 μm technology from the foundry UMC. In order to analyse the effect of single-event transients in this receiver, it has been studied how current pulses generated in the low-noise amplifier propagate down the receiver chain. The effect of the different circuits that form the receiver on this kind of pulse has been studied prior to the analysis of the complete receiver. First, the effect of SETs in low-noise amplifiers was analysed. Then, the propagation of pulses through mixers was studied. The effect of filters in the analysed current pulses has also been studied. Regarding the analysis of the designed RF receiver, an amplitude and phase shift was observed under the presence of SETs.