It is constructively proved that any nonconstant Boolean function may be realized (over an arbitrary complete basis of gates) by a testable combinational circuit admitting (under single inverse or arbitrary constant faults at outputs of gates) a single fault detection test set whose cardinality does not exceed 4.Keywords: circuit of functional elements, single fault detection test, constant fault at the output of gate, Shannon function, length of a test, easily testable circuit.
We describe a method of construction of circuits over some special basis admitting complete tests detecting arbitrary constant faults at the outputs of gates and having length not exceeding 4.
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