A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length

Romanov, D. S.

doi:10.3103/s0027132212020064

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“…Kolyada [12][13][14] showed that, for any ∈ ℕ, in an arbitrary complete basis the Shannon function for the length of a single fault detection test with respect to arbitrary constant faults at the outputs of the gates is at most + 3. The author of the present paper has put forward [15] two examples of complete bases of functional elementš ὔ , ὔὔ such that ̌ ὔ ( ) ≤ 4. He also showed [16] that in the basiš ὔὔ the Shannon function for the length of a complete fault detection test with respect to arbitrary constant faults at the outputs of the gates is at most 4 for any nonnegative integer .…”

Section: Introduction and Basic De Nitionsmentioning

confidence: 99%

Method of synthesis of easily testable circuits admitting single fault detection tests of constant length

Romanov

2014

Discrete Mathematics and Applications

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It is constructively proved that any nonconstant Boolean function may be realized (over an arbitrary complete basis of gates) by a testable combinational circuit admitting (under single inverse or arbitrary constant faults at outputs of gates) a single fault detection test set whose cardinality does not exceed 4.Keywords: circuit of functional elements, single fault detection test, constant fault at the output of gate, Shannon function, length of a test, easily testable circuit.

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