A new parameter, hardness/modulus2 (H/E2), has been derived from the equations used to calculate the hardness and elastic modulus from data taken during continuous depth-sensing microindentation tests. This paper discusses the use of this parameter to treat the data obtained from a sample whose surface roughness was of the same scale as the size of the indents. The resulting data were widely scattered. This scatter was reduced when the data were plotted in terms of H/E2 versus stiffness. The effect of surface roughness on the hardness and elastic modulus results is removed via stiffness measurements, provided single contacts are made between the indenter and the specimen. The function relating the cross-sectional area of the indenter versus the distance from its point is not required for calculation of H/E2, but the hardness and modulus cannot be determined separately. The parameter H/E2 indicates resistance to plastic penetration in this case.

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Ion beam mixing of thin oxide f'dms on sapphire substrates has been studied in order to examine any role of equilibrium thermodynamic parameters on the mixing process.Mixing experiments were performed with polycrystalline oxide films deposited on single crystalline o_-A1203substrates. According to the equilibrium phase diagrams, Cr203 is completely soluble in o_-A1203,while ZrO2 is insoluble. The couples we_'eirradiated with Cr ions (160 and 340 keV) or Kr ions to fluences of 4 x 1016ions/cm 2 at temperatures between 20 and 900°C. Rutherford backscattering spectrometry, x-ray photoelectron spectroscopy, and transmission electron microscopy were used to analyze samples before and after irradiation to determine the extent and nature of interface modifications. No longrange mixing was detected under any condition studied; the width of the "mixed" region in each case was consistent with recoil mixing. The absence of long-range mixing is rationalized in terms of the different ranges of oxygen ions and cations.