The advanced molybdenum-based rare process experiment (AMoRE) aims to search for neutrinoless double beta decay ($$0\nu \beta \beta $$0νββ) of $$^{100}$$100Mo with $$\sim 100\,\hbox {kg}$$∼100kg of $$^{100}$$100Mo-enriched molybdenum embedded in cryogenic detectors with a dual heat and light readout. At the current, pilot stage of the AMoRE project we employ six calcium molybdate crystals with a total mass of 1.9 kg, produced from $$^{48}$$48Ca-depleted calcium and $$^{100}$$100Mo-enriched molybdenum ($$^{48{{\text {depl}}}}\hbox {Ca}^{100}\hbox {MoO}_{4}$$48deplCa100MoO4). The simultaneous detection of heat (phonon) and scintillation (photon) signals is realized with high resolution metallic magnetic calorimeter sensors that operate at milli-Kelvin temperatures. This stage of the project is carried out in the Yangyang underground laboratory at a depth of 700 m. We report first results from the AMoRE-Pilot $$0\nu \beta \beta $$0νββ search with a 111 kg day live exposure of $$^{48{{\text {depl}}}}\hbox {Ca}^{100}\hbox {MoO}_{4}$$48deplCa100MoO4 crystals. No evidence for $$0\nu \beta \beta $$0νββ decay of $$^{100}$$100Mo is found, and a upper limit is set for the half-life of $$0\nu \beta \beta $$0νββ of $$^{100}$$100Mo of $$T^{0\nu }_{1/2} > 9.5\times 10^{22}~\hbox {years}$$T1/20ν>9.5×1022years at 90% C.L. This limit corresponds to an effective Majorana neutrino mass limit in the range $$\langle m_{\beta \beta }\rangle \le (1.2-2.1)\,\hbox {eV}$$⟨mββ⟩≤(1.2-2.1)eV.
We report an exploitation of the optical comb of a femtosecond pulse laser as the wavelength ruler for the task of absolute length calibration of gauge blocks. To that end, the optical comb was stabilized to the Rb clock of frequency standard and an optical frequency synthesizer was constructed by tuning an external single-frequency laser to the optical comb. The absolute height of gauge blocks was measured by means of multi-wavelength interferometry using multiple beams of different wavelengths consecutively provided by the optical frequency synthesizer. The wavelength uncertainty was measured 1.9 x 10(-10) that leads to an overall calibration uncertainty of 15 nm (k=1) in determining the absolute length of gauge blocks.
We have proposed and demonstrated a novel method that can determine both the geometrical thickness and refractive index of a silicon wafer at the same time using an optical comb. The geometrical thickness and refractive index of a silicon wafer was determined from the optical thickness using phase information obtained in the spectral domain. In a feasibility test, the geometrical thickness and refractive index of a wafer were measured to be 334.85 microm and 3.50, respectively. The measurement uncertainty for the geometrical thickness was evaluated as 0.95 microm (k = 1) using a preliminary setup.
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